Evaluating imperceptible defects—we are professionals in durability evaluation of PID
PID (Potential Induced Degradation) is a defect of output reduction caused by the potential difference between the cells and the metal frame. The PID of photovoltaic modules can be a serious problem depending on the PID resistance of the photovoltaic modules, the system configuration, and the environmental conditions around the photovoltaic facility.
The simplest way to prevent PID is to adopt photovoltaic modules with sufficient PID resistance. PID testing is required to evaluate PID resistance performance. Chemitox has been conducting PID testing since 2011, the first laboratory in Japan. We have developed a more stringent PID test method of our own and evaluate solar cell modules. At Chemitox we conduct tests not only Chemitox method but also all PID test methods including IEC TS 62804-1, a and b.
Major standards for Photovoltaic modules
| Testings | Standards |
|---|---|
| Visual Inspection | IEC61730-2、IEC61215、IEC61215-2、IEC61646 |
| Accessibility Test | IEC61730-2 |
| Cut Susceptibility Test | IEC61730-2、UL1703 |
| Continuity of equipotential bonding | IEC61730-2、UL1703 |
| Impulse Voltage Test | IEC61730-2 |
| Temperature Test | IEC61730-2、UL1703 |
| Fire Test | IEC61730-2、UL1703 |
| Reverse Current Overload Test | IEC61730-2、UL1703 |
| Module Breakage Test | IEC61730-2 |
| Maximum Power Determination | IEC61215、IEC61215-2、IEC61646 |
| Insulation Test | IEC61215、IEC61215-2、IEC61646 |
| Outdoor Exposure Test | IEC61215、IEC61215-2、IEC61646 |
| Hot-spot Endurance Test | IEC61730-2、IEC61215-1、IEC61215-2、IEC61646、 UL1703 |
| UV Preconditioning Test | IEC61730、IEC61215、IEC61215-2、IEC61646 |
| Thermal Cycling Test | IEC61730-2、IEC61215、IEC61215-2、IEC61646、 UL1703 |
| Humidity Freeze Test | IEC61730-2、IEC61215、IEC61215-2、IEC61646、 UL1703 |
| Damp Heat Test | IEC61730-2、IEC61215、IEC61215-2、IEC61646 |
| Robustness of Terminations Test | IEC61730-2、IEC61215、IEC61646 |
| Wet Leakage Current Test | IEC61215、IEC61215-2、IEC61646、UL1703 |
| Mechanical Load Test | IEC61730-2、IEC61215、IEC61215-2、IEC61646、 IEC62782CD |
| Bypass Diode Thermal Test | IEC61730-2、IEC61215、IEC61215-2、IEC61646 |
| Light-soaking | IEC61646 |
| Salt Mist Test | IEC61701、IEC 60068-2-52 |
| EL Inspection | － |
| Detection of PID Test | IEC62804-1 etc. |
| Root Cause Analysis and Test of Snail Trails | － |
Contact information
PIC: Mitsuya Mochizuki (Mr.)
TEL:+81-551-42-5061
