Power Cycle Test/Transient Thermal Resistance Tester (T3Ster)
Maximum Load current of 1800A
The T3Ster test evaluates durability of power devices against electrical or thermal stress when they are electrically stressed periodically under ON / OFF states. The transient thermal resistance measurement mechanism (T3Ster) can detects failure phenomenon non-destructively,for example in structures around semiconductor chip, joint structures of chip – substrate -metal base plate, or cracks in joint structure of solder - AI wire.
Specification:
Maximum load current: 1800A (maximum)/12ch/12V
Specification:
Maximum load current: 1800A (maximum)/12ch/12V
Contact information
PIC: Tomoki Sumida (Mr.)
TEL:+81-3-3727-7111
Standards
| Test | Standard number | Standard | Target object |
|---|---|---|---|
| Power Cycle Test/Transient Thermal Resistance Test(T3Ster) | IEC60749-34 | Semiconductor devices – Mechanical and climatic test methods – Part 34: Power cycling | Power semiconductor device |
| AQG-324 | Qualification of Power Modules for Use in Power Electronics Converter Units (PCUs) in Motor Vehicles | Automotive PCU | |
| JEITA ED-4701/600 | Environmental and durability test method of semiconductor device (Specific test for discrete semiconductors) | Power semiconductor device |