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pwb reliability evaluation

ION MIGRATION TEST

Example of Migration Test Pattern
Set-up for Migration Testing

Analysis of Migration Data


Getting the Appropriate Reliability for the Higher Density


  • Evaluation of Dielectric Property of Solder Resists
  • Evaluation of Dielectric Property between Through-holes
  • Evaluation of Dielectric Property of the Flux
  • Evaluation of Dielectric Property of Substrates of PDPs and LCDs
  • Evaluation of Dielectric Property of Integrated Circuit Boards
  • Evaluation of Dielectric Property of Au, Ag and Cu Plated Boards
  • Evaluation of Dielectric Property of Pb-free Solder
  • Evaluation of Dielectric Property of CSP Mounting Packages


Adding Value through Reliability Testing


To achieve the very basic level of any kind of quality assurance for a product, it is crucial to refine quality in every stage of product development from design to production across all departments. By applying findings and data obtained from the reliability testing and analysis, this reliability can be further improved, adding value to the end-product. However, these reliability tests must be carried out with accuracy in order to maximize the benefits. Take advantage of our reliability testing to achieve higher value through quality assurance.



For Further Details about these Tests, Contact:
Hitoshi Watanabe (h-watanabe@chemitox.co.jp)